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1. Transmission Electron Microscopy: A Textbook for Materials Science by David B. Williams, C. Barry Carter | |
Paperback: 832
Pages
(2009-08-05)
list price: US$99.00 -- used & new: US$57.13 (price subject to change: see help) Asin: 0387765026 Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment. Customer Reviews (16)
A good introduction for the typical materials scientist
waste too many pages
TEM Bible
The bible of electron microscopy
good book for TEM |
2. Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael | |
Hardcover: 689
Pages
(2003-02)
list price: US$99.00 -- used & new: US$71.47 (price subject to change: see help) Asin: 0306472929 Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description Customer Reviews (8)
Excellent so far.
The Bible of All Scanning Electron Microscopy Books
Excellent outline of SEM and X-Ray microanalysis
Great Book !!
Book |
3. Electron Microscopy, 2nd Edition by John J. Bozzola, Lonnie D. Russell | |
Hardcover: 670
Pages
(1998-10)
list price: US$160.95 -- used & new: US$48.20 (price subject to change: see help) Asin: 0763701920 Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description Customer Reviews (9)
Good INTRODUCTION; not for in-depth study
Excellent book
Good book to start with
Perfect!
Was not bad on shipping time, but NOT NEW as listed. |
4. Advanced Computing in Electron Microscopy by Earl J. Kirkland | |
Hardcover: 289
Pages
(2010-08-31)
list price: US$129.00 -- used & new: US$103.20 (price subject to change: see help) Asin: 1441965327 Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description This book provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help interpret and understand high resolution information in recorded electron micrographs. This revised edition contains new sections on recent instrumental developments and updated references. It should be useful for beginning and experienced users at the advanced undergraduate or graduate level. This new edition will be a revision of the existing text, including new developments in this field since the original manuscript and updated references. Additional material will include abberration corrected instruments and confocal electron microscopy. The references and examples will be improved and expanded and some sections polished to improve ease of understanding. Customer Reviews (2)
A must read electron microscopy book
Good book for the dedicated transmission electron microscopist |
5. Bioimaging: Current Techniques in Light & Electron Microscopy by Douglas Chandler, Robert W. Roberson | |
Hardcover: 456
Pages
(2008-09-16)
list price: US$139.95 -- used & new: US$39.99 (price subject to change: see help) Asin: 0763738743 Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description Customer Reviews (1)
Good effort |
6. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM by R. Egerton | |
Paperback: 202
Pages
(2010-11-02)
list price: US$89.95 -- used & new: US$71.97 (price subject to change: see help) Asin: 1441938370 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy. |
7. Scanning and Transmission Electron Microscopy: An Introduction by Stanley L. Flegler, John W. Heckman Jr., Karen L. Klomparens | |
Hardcover: 240
Pages
(1993-09-23)
list price: US$72.95 -- used & new: US$67.20 (price subject to change: see help) Asin: 0195107519 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description |
8. Electron Microscopy of Model Systems, Volume 96 (Methods in Cell Biology) | |
Hardcover: 744
Pages
(2010-09-06)
list price: US$156.00 -- used & new: US$140.39 (price subject to change: see help) Asin: 0123810078 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description This volume covers the preparation and analysis of model systems for biological electron microscopy.This will be the first compendium covering the various aspects of sample preparation of very diverse biological systems. |
9. Principles and Techniques of Electron Microscopy by M. A. Hayat | |
Hardcover: 267
Pages
(1975-05)
list price: US$19.95 -- used & new: US$24.99 (price subject to change: see help) Asin: 0442256817 Canada | United Kingdom | Germany | France | Japan | |
10. Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists by Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin | |
Hardcover: 840
Pages
(1992-05-31)
list price: US$101.00 -- used & new: US$150.05 (price subject to change: see help) Asin: 0306441756 Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Customer Reviews (4)
Excellent book for all types of audience
Excellent text Goldstein covers everything from the basics of operation, through image formation, sample prep, usage in particular fields of study -- everything! If you get one SEM book, get this one.
A very good text book to own
Excellent resource for Electron Microscopists |
11. Three-Dimensional Structure of Wood; A Scanning Electron Microscope Study (Syracuse Wood Science Series, 2) by B. A. Meylan, B. G. Butterfield | |
Paperback: 80
Pages
(1972-06)
list price: US$34.50 -- used & new: US$20.99 (price subject to change: see help) Asin: 0815650302 Canada | United Kingdom | Germany | France | Japan | |
12. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) by Ludwig Reimer | |
Paperback: 527
Pages
(2010-11-02)
list price: US$179.00 -- used & new: US$142.21 (price subject to change: see help) Asin: 3642083722 Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description Customer Reviews (1)
A very good book |
13. Scanning Transmission Electron Microscopy: Imaging and Analysis | |
Hardcover: 550
Pages
(2010-12-10)
list price: US$169.00 -- used & new: US$135.20 (price subject to change: see help) Asin: 1441971998 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy. |
14. Introduction to Scanning Transmission Electron Microscopy (Royal Microscopical Society Microscopy Handbooks) by Dr Robert Keyse, Anthony J. Garratt-Reed, P.J. Goodhew, Prof Gordon Lorimer | |
Paperback: 128
Pages
(1997-12-01)
list price: US$67.95 -- used & new: US$34.06 (price subject to change: see help) Asin: 1859960669 Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique. Customer Reviews (1)
Good, but not in-depth However, this is a short book, and doesn't go into much detail.It would be a good book for someone just starting out in STEM, but anyone with STEM experience might find only a few bits and pieces of the book enlightening. ... Read more |
15. Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe | |
Hardcover: 758
Pages
(2007-10-11)
list price: US$129.00 -- used & new: US$77.39 (price subject to change: see help) Asin: 3540738851 Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. Customer Reviews (4)
There are better books out there
Redudant and unclear
Excellent TEM book
wrote by TEM expert |
16. Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin | |
Hardcover: 330
Pages
(2009-03-19)
list price: US$99.00 -- used & new: US$70.97 (price subject to change: see help) Asin: 0387857303 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. While the Handbook complements the best-selling textbook, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, by Goldstein, et al., it is entirely self-contained and describes what is needed up to the point the sample is put into the instrument. Photomicrographs of each specimen complement the many sample preparation “recipes”. Additional chapters describe the general features of specimen preparation in relation to the different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals and equipment applicable to any of the recipes. This authoritative yet practical Handbook is an essential reference for anyone who uses these instruments, and assumes only an elementary knowledge of preparation techniques to guide the reader through the specific protocols. |
17. Electron Microprobe Analysis and Scanning Electron Microscopy in Geology by S. J. B. Reed | |
Paperback: 212
Pages
(2010-06-10)
list price: US$31.99 -- used & new: US$26.26 (price subject to change: see help) Asin: 052114230X Average Customer Review: Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description Customer Reviews (1)
Excellent Book on the Basics |
18. Electron Microscopy and Analysis, Third Edition by Peter J. Goodhew, John Humphreys, Richard Beanland | |
Paperback: 254
Pages
(2000-11-30)
list price: US$65.95 -- used & new: US$30.00 (price subject to change: see help) Asin: 0748409688 Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description |
19. Electron Diffraction in the Electron Microscope (Monographs in practical electron microscopy in materials science) by J.W. Edington | |
Paperback: 132
Pages
(1975-12)
Isbn: 0333182928 Canada | United Kingdom | Germany | France | Japan | |
20. Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences) by Ludwig Reimer, Helmut Kohl | |
Paperback: 590
Pages
(2010-11-02)
list price: US$159.00 -- used & new: US$159.00 (price subject to change: see help) Asin: 144192308X Canada | United Kingdom | Germany | France | Japan | |
Editorial Review Product Description |
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